Application Note 9517
Table 1 lists the operating conditions for the power supplies.
TABLE 1. POWER SUPPLIES
Input Clock Driver and Timing
The clock input to the HI5174 evaluation board should be
POWER
SUPPLY
+5VA
-5.2VA
+5VD
+12V
-12V
MIN
+4.75V
-5.3V
+4.75V
+10V
-10V
TYP
+5.0V
-5.2V
+5.0V
+12V
-12V
MAX
+5.25V
-5.0V
+5.25V
+15V
-15V
CURRENT
TYP
25mA
-120mA
136mA
25mA
-20mA
driven with a standard TTL level signal. U4 (75F04) will
buffer the clock input and drive the HI5714 as well as the 26
pin connector. For optimum performance of the HI5714 the
duty cycle of the clock should be kept at 50% ± 10%. U5 and
U6 (74F541) will buffer the output bits and keep the power
transients caused by charging a large bus capacitance off
the supplies to the ADC.
As with any high speed ADC, clock jitter (in this case
external) must be accounted for. Clock jitter will cause the
Reference Circuit
For the following discussion, refer to the board schematic
and the board layout drawing.
The HI5714 requires two reference voltages: V RT and V RB .
The external voltage reference generator on the evaluation
converter to sample at a nonuniform rate, thus having the
effect of distorting the digital representation and raise the
noise floor. For this reason, users should take care to
provide as uniform a clock signal as possible to assure
optimal performance.
TABLE 2. TIMING SPECIFICATIONS
board is used to generate a V RT of about 3.6V and a V RB of
about 1.3V. The ICL8069 reference diode generates a 1.2V
voltage that is gained up by two op amps to the reference
voltages V RT and V RT for the ADC. V RT should be kept in
the range of 3.5V to 3.9V. P1 is adjusted at the factory for a
V RB of 1.3V ± 2mV.
Analog Input
PARAMETER
t OD
t PD1
t PD2
t PD3
DESCRIPTION
HI5714 Data Delay
74F04 Prop Delay
74F04 Prop Delay
74F541 Prop Delay
MIN
-
2.4ns
2.4ns
2.1ns
TYP
10ns
-
-
-
MAX
13ns
8.5ns
8.5ns
7.5ns
The analog input to the HI5174 can be configured in various
ways depending on the input signal and the required level of
performance. A signal voltage with a maximum span of V RT to
V RB can be AC coupled to the HI5714 through the V IN2 BNC
and applied to the ADC by installing jumper JP2. P4 would be
adjusted to center the signal in the range of the HI5714. This
may or may not be adequate depending on the type of input
signal.
Figure 6 shows the timing for the evaluation board. The data
corresponding to a particular sample will be available at the
output of the HI5714 after the required data latency (1 cycle)
plus an output delay. Table 2 lists the values that can be
expected for the various timing delays. Refer to the
datasheet for additional timing information.
CLK1
INPUT
An HA5020 buffer (as shown in Figure 5) is also provided
that can be used to drive the part by inserting JP1. The gain
of the circuit can be calculated from:
HI5714
CLOCK
t PD1
V OUT = – ? ------- ? V IN + ? 1 + ------- ? ? --------------------- ? V OFFSET
? R 9 ? ? R 9 ? ? R 1 ?
? R 7 ? ? R 7 ? ? R 1 + R 2 ?
The combination of the buffer and the external reference will
give the best performance for the HI5714 and allow the most
INPUT
HI5714
DATA0-7
OUTPUT
t OD
t PD2
DATA
DATA
flexibility when dealing with various types of input signals. If
an application is extremely cost sensitive then the internal
bias generators along with the AC coupled version of the
CLK OUT
(74ACT04)
t PD3
input circuit can be used.
DOUT0-7
(74ACT541)
DATA
DATA
V IN
R 7
R 9
-
+
R 2
V IN
FIGURE 6. INPUT-TO-OUTPUT TIMING
DAC Setup
V OFFSET
0.1 μ F
R 2 R 1
FIGURE 5. MODIFIED BUFFER
The HI5721 is used as a reconstruct DAC to allow the user
to easily view the performance of the HI5714. The HI5721 is
a TTL, 10-bit, 125MHz DAC.
The internal reference in the HI5721 is a -1.25V (typical)
bandgap voltage reference with a 100 μ V/ o C temperature
drift. The internal reference should be buffered by the
3
相关PDF资料
HI5728EVAL1 EVALUATION PLATFORM TQFPHI5728
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HI5741-EVS EVALUATION PLATFORM HI5741
HI5760EVAL1 EVALUATION PLATFORM SOIC HI5760
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